There is a gamut of particle size distribution measurement techniques each with established history and advantages. The killer word in particle size distribution is the last one (distribution) and measurement of broad distributions is the bane of all sizing techniques.
After a very short introduction to ‘how much sample should we measure to describe the distribution’, Malvern Panalytical will be running through the background of some of the more popular techniques (such as sieves, sedimentation and electrical-sensing zone) and will emphasize the popular light scattering techniques of laser diffraction and dynamic light scattering (DLS). As an aside the company will mention small-angle X-ray scattering (SAXS).
Malvern Panalytical looks at counting techniques, especially those in the nanotechnology such as nanotracking analysis (NTA), resonant mass measurement (RMM) and regulatory (obscuration counting) arena.
In line with the statement in the US Pharmacopoeia (USP) <766>, optical microscopy “For irregularly shaped particles, characterisation of particle size must also include information on particle shape’, Malvern Panalytical will look at the benefits of high-speed image analysis where statistically valid numbers of particles can be counted and measured for both size and shape distribution.
In addition, the company will point out two international standards that provide an overview to available methods.
This webinar will take place on 23/10 from 10:30 (GMT-5:00) and 11:30.
Speaker Alan Rawle will host the event, which is suitable for anyone who’d benefit from learning the basics of the huge number of particle sizing techniques that are available and receiving some hints on selecting the best technique for their application.
Attendees will learn a thorough overview of the relative advantages and disadvantages of a multitude of techniques used in particle size distribution determination, as well as some of the reasons why light scattering techniques have become popular in the nano- and post-micron size regions.