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Orthogonal and Complementary Nanoparticle Characterization Techniques

Published 17 February 2016 | By Malvern Panalytical

How can I trust my data? This is a common concern for many researchers using particle measurement instrumentation. Is the data affected in any way by the measurement technology, or alternatively by the user during sample preparation or by the analysis parameters employed? To answer this question we need to consider the use of independent and orthogonal measurement techniques in order to provide confidence and measurement validation.

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Orthogonal and Complementary Nanoparticle Characterization Techniques