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Malvern Panalytical

Particle Size and Shape Analysis, Zeta Potential and NIR-Chemical Imaging.

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Particle and Molecular Characterisation Focus for Malvern Instruments Short Courses at Pittcon 2011

The first one of these courses will take place on 14 March and covers the fundamentals of particle sizing with an emphasis on light scattering techniques. The second, taking place on 16 March, examines molecular and particle characterisation by dynamic light scattering and zeta potential. Registration is open for both via the Pittcon website.

‘Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques’ will bring newcomers to the particle sizing field up to speed on the basics of particle size analysis. The main techniques (sieves, sedimentation, electrozone sensing) will be covered with an emphasis on dynamic light scattering and laser diffraction.

‘Molecular and Particle Characterization by Dynamic Light Scattering and Zeta Potential’ will discuss, review and provide useful tips for dynamic light scattering (DLS, PCS, QELS), molecular weight and electrophoretic light scattering (zeta potential) measurements.

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